... Figure 1-14: MOS-Al-K at 1.48 keV (left) and PN Cu-K at 8.04 keV (right) internal background caused by X-ray fluorescence lines correlated with the structures of the electronic board (pn-Cu-K) and the more distant camera itself (MOS Al-K) 1.6 Timing ...
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Ссылки http://xmm.vilspa.esa.es/docs/documents/CAL-TN-0018-2-2.pdf -- 1829.9 Кб -- 12.07.2004 Похожие документы
... Figure 1-14: MOS-Al-K at 1.48 keV (left) and PN Cu-K at 8.04 keV (right) internal background caused by X-ray fluorescence lines correlated with the structures of the electronic board (pn-Cu-K) and the more distant camera itself (MOS Al-K) 1.6 Timing ...
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Ссылки http://xmm.vilspa.esa.es/docs/documents/CAL-TN-0018-2-3.pdf -- 1838.0 Кб -- 28.07.2004 Похожие документы
... extract a background light curve, using all the selection expressions defined so far, and the same binsize (100 seconds) and energy range as for the source+background light curve . ...
... extract a background light curve ( PN_lightcurve_background.fits ) from a region of the PN field-of-view free from ... withbkgtsset active . bkgtsset to the file name of the background light curve ( PN_lightcurve_background.fits ) . ...
... A remaining irritation with this procedure is that XMM images include a non-vignetted background component (due to X-ray uorescence of the substrate, among other things). ...
... HEXTE will measure point-like X-ray sources within the intensity range 0.01 to 100 times background in the 15--250 keV range with 10 µs time resolution and better than 18% energy resolution" · Control of systematics allows for easier calibrations. ...
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Ссылки http://xmm.vilspa.esa.es/external/xmm_sw_cal/icwg/presentations/HEXTE_cal_ROTHSCHILD.pdf -- 497.8 Кб -- 19.06.2006 Похожие документы
... However, there are cases where the determination of the background from the same observation is difficult, either due to the ... to identify field-of-view regions, where the target source does not substantially contribute to the total X-ray counts ...