... topography it is possible to visualise point defects and dislocations with spatial resolution of 2 + 3 mm, to analyse their dynamics upon application of a mechanical stress (for example, in piezoelectric crystals), as well as to study local distortions ...
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Ссылки http://chem.msu.ru/rus/lab/phys/cryschem/liter/pap_3_eng.pdf -- 552.3 Кб -- 31.01.2011 Похожие документы
... 401-409 Marc Pera-Titus, Reyes Mallada, Joan Llorens, Fidel Cunill and Jesћs Santamarэa A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography Pp. ...
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Ссылки http://chem.msu.ru/rus/journals/membranes/31/31-fulltext.pdf -- 2250.4 Кб -- 19.12.2006 Похожие документы