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: http://www.sai.msu.su/sal/Z/4/IMD.html
Дата изменения: Unknown Дата индексирования: Sat Dec 22 05:51:14 2007 Кодировка: |
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IMD
IMD is a point-and-click IDL application that can calculate the optical properties - reflectance, transmittance, and absorptance - of an arbitrary multilayer structure, i.e., a structure consisting of any number of layers of any thickness, and of any material. IMD includes a database of optical constants for over 150 materials, spanning the photon range from the X-ray region to the far infrared. It's also easy to use your own optical constants if necessary, or to create new X-ray optical constants for any compound, using the CXRO tabulated atomic scattering factors for 92 elements. IMD can be used for both modeling, and for parameter estimation by non-linear, least-squares curve-fitting (including confidence interval generation) to your own measured data. IMD can also compute the electromagnetic field intensity vs. depth in a multilayer structure.
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Current Version: 3.1
License Type: Free for Non-Commercial Use
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Home Site:
Source Code Availability: Yes
Available Binary Packages:
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