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: http://www.sai.msu.su/sal/D/1/SPEC.html
Дата изменения: Unknown Дата индексирования: Sat Dec 22 06:00:43 2007 Кодировка: |
spec
X-Ray Diffraction and Data Acquisition software from Certified Scientific Software provides scientists with reliable instrument control at more than 125 X-ray and neutron diffractometers at over 60 locations in the United States and abroad. Developed in 1986 for X-ray diffraction experiments, spec's portability, flexibility and power are winning it increasing application as general-purpose data-acquisition software. It is available on a wide range of UNIX platforms (including Linux) and supports numerous hardware configurations. Included with spec (and also available separately) is the C-PLOT Scientific Graphics and Data Analysis package. Together, these programs can take you from data acquisition, through data analysis, to preparation of figures for publication.
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Current Version: 3.03.34
License Type: Commercial
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