Документ взят из кэша поисковой машины. Адрес оригинального документа : http://www.nano.msu.ru/files/news/20121014-sample.pdf Дата изменения: Sun Oct 14 16:17:21 2012 Дата индексирования: Sat Feb 2 22:36:02 2013 Кодировка:

Sample Submission Form for Example Measurements
In order to provide the best and most appropriate measurement/results, the customer is asked to please fill in the following form and enclose it with the sample. ( ) This form or equivalent information is required prior to the sample measurements.

Customer Details:
Name: _______________________ Institution: _______________________ E-Mail: _______________________ City, Country: _______________________ Phone: _____________________ Fax: _____________________

____

____

Sample Description / Sample Properties:
Transparent Opaque Dimensions: _______________ Substrate:______________

General description of the samples (if necessary please also note aspects of storage, toxicity or general handling of the sample). If more than one samples are provided, please prioritize the different samples and identify clearly where on the sample the measurement should be performed:

Requested Measurement Modes:
Atomic Force Microscopy (AFM) Confocal Raman Microscopy Scanning Near-field Optical Microscopy (SNOM) Other AC Mode Pulsed Force Mode


Sample Preparation:
In general, the sample should be fully prepared for microscopic measurements. WITec can not provide specialised sample preparation.

Measurement Goal:
What's the goal of the measurement? If possible please provide existing images or spectra.

:





© 2011 by Witec Wissenschaftliche Instrumente und Technologie GmbH, www.WITec.de