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Ahlers F.J.

Ñîàâòîðû: Niemeyer J., Êðóïåíèí Â.À., Lotkhov S.V., Weimann T., Wolf H., Çîðèí À.Á., Scherer H., Ïðåñíîâ Ä.Å., Huls J., Pashkin Y.A., Quenter D., Weis J., šKlaffs T. ïîêàçàòü ïîëíîñòüþ..., Êóçüìèí Ë.Ñ., Òàâõåëèäçå À.Í.

8 ñòàòåé, 3 òåçèñîâ äîêëàäîâ

Êîëè÷åñòâî öèòèðîâàíèé ñòàòåé â æóðíàëàõ ïî äàííûì Web of Science: 225, Scopus: 207

IstinaResearcherID (IRID): 544427

Äåÿòåëüíîñòü ñòèëü:  îáû÷íûé | ÃÎÑÒ | plain | abbrv | acm | alpha | amsalpha | amsplain | apalike | ieeetr | siam

• Ñòàòüè â æóðíàëàõ

  • 
    • 1999 Charging and heating effects in a system of coupled single-electron devices
    • Krupenin V.A., Lotkhov S.V., Scherer H., Zorin A.B., Weimann Th, Ahlers F.J., Niemeyer J., Wolf H.
    • â æóðíàëå Physical Review B - Condensed Matter and Materials Physics, èçäàòåëüñòâî American Institute of Physics (United States), òîì 59, ? 16, ñ. 10778-10784
  • 
    • 1997 Investigation of the offset charge noise in single electron tunneling devices
    • Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B., Krupenin V.A., Lotkhov S.V., Presnov D.E.
    • â æóðíàëå IEEE Transactions on Instrumentation and Measurement, èçäàòåëüñòâî Institute of Electrical and Electronics Engineers (United States), òîì 46, ? 2, ñ. 303-306 DOI
  • 
    • 1996 An all-chromium single electron transistor: A possible new element of single electronics
    • Kuzmin L.S., Pashkin Y.A., Tavkhelidze A.N., Ahlers F.J., Weimann T., Quenter D., Niemeyer J.
    • â æóðíàëå Applied Physics Letters, èçäàòåëüñòâî American Institute of Physics (United States), òîì 68, ? 20, ñ. 2902-2904 DOI
  • 
    • 1996 Background charge noise in metallic single-electron tunneling devices
    • Zorin A.B., Ahlers F.J., Niemeyer Th Weimann J, Wolf H., Krupenin V.A., Lotkhov S.V.
    • â æóðíàëå Physical Review B - Condensed Matter and Materials Physics, èçäàòåëüñòâî American Institute of Physics (United States), òîì 53, ? 20, ñ. 13682-13687 DOI
  • 
    • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • â æóðíàëå Czechoslovak Journal of Physics, èçäàòåëüñòâî Kluwer Academic/Plenum Publishers (United States), òîì 46, ? 4, ñ. 2283-2284 DOI
  • 
    • 1996 Detection of the single electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • â æóðíàëå Czechoslovak Journal of Physics, èçäàòåëüñòâî Kluwer Academic/Plenum Publishers (United States), òîì 46, ? 4, ñ. 2281-2282 DOI

• Ñòàòüè â ñáîðíèêàõ

  • • 2002 Hysteresis effects due to eddy currents in the integer quantum Hall regime probed by an SET-electrometer
    • Klaffs T., Presnov D., Krupenin V.A., Huls J., Weis J., Ahlers F.J.
    • â ñáîðíèêå ASDAM ?02 - The Fourth International Conference on Advanced Semiconductor Devices and Microsystems, ìåñòî èçäàíèÿ IEEE Smolenice Castle, Slovakia, 14-16 October, ñ. 337-340 DOI
  • 
    • 1996 The offset charge noise in single electron tunneling devices
    • Ahlers F.J., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Weimann T., Wolf H., Zorin A.B.
    • â ñáîðíèêå CPEM (Conference on Precision Electromagnetic Measurements) Digest. Proceedings of the 1996 Conference on Precision Electromagnetic Measurements (17-20 June 1996, Braunschweig, Germany), èçäàòåëüñòâî IEEE (Piscataway, NJ, United States), ñ. 507-508 DOI

• Òåçèñû äîêëàäîâ

  • • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • â ñáîðíèêå Abstracts of the 21st International Conference on Low Temperature Physics, ìåñòî èçäàíèÿ Prague, Czech Republic, 8-14 August, òåçèñû, ñ. 308
  • • 1996 Detection of the single-electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • â ñáîðíèêå Abstracts of the 21st International Conference on Low Temperature Physics, ìåñòî èçäàíèÿ Prague, Czech Republic, 8-14 August, òåçèñû, ñ. 308
  • • 1996 Verification of a memory cell based on a single electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B.
    • â ñáîðíèêå Abstracts of IX Trilateral German - Russian - Ukrainian Seminar on High-Temperature Superconductivity, ìåñòî èçäàíèÿ Gabelbach Germany, 22-25 September, òåçèñû, ñ. 22