ÈÑÒÈÍÀ

Ristau Detlev

Ñîàâòîðû: Òèõîíðàâîâ À.Â., Òðóáåöêîâ Ì.Ê., Àìî÷êèíà Ò.Â., Duparre A., Quesnel E., Ehlers H., Schlichting S., Masetti E., Gunster S., Kiriakidis G., Pervak V., Peiro F., Bosch S. ïîêàçàòü ïîëíîñòüþ..., ×èðêèí À.Ñ., Ferre-Borrull J., DeBell G., Death D., Sytchkova A.K., Tikhonravov A.A., Starke R., Êîêàðåâ Ì.À., Welling H., Francis R.J., Jup? M., Krasilnikova A.V., Grilli M.L., Giinster S., Lappschies M., Andrei T.

8 ñòàòåé, 6 òåçèñîâ äîêëàäîâ

Êîëè÷åñòâî öèòèðîâàíèé ñòàòåé â æóðíàëàõ ïî äàííûì Scopus: 213, Web of Science: 162

IstinaResearcherID (IRID): 538622

Äåÿòåëüíîñòü ñòèëü:  îáû÷íûé | ÃÎÑÒ | plain | abbrv | acm | alpha | amsalpha | amsplain | apalike | ieeetr | siam

• Ñòàòüè â æóðíàëàõ

  • 
    • 2013 Quality control of oblique incidence optical coatings based on normal incidence measurement data
    • Amotchkina Tatiana V., Trubetskov Michael K., Tikhonravov Alexander V., Schlichting Sebastian, Ehlers Henrik, Ristau Detlev, Death David, Francis Robert J., Pervak Vladimir
    • â æóðíàëå Optics Express, èçäàòåëüñòâî Optical Society of America (United States), òîì 21, ? 18, ñ. 21508-21522 DOI
  • 
    • 2012 Computational manufacturing as a key element in the design-production chain for modern multilayer coatings
    • Amotchkina Tatiana V., Schlichting Sebastian, Ehlers Henrik, Trubetskov Michael K., Tikhonravov Alexander V., Ristau Detlev
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 51, ? 31, ñ. 7604-7615 DOI
  • 
    • 2012 Computational manufacturing as a tool for the selection of the most manufacturable design
    • Amotchkina Tatiana V., Schlichting Sebastian, Ehlers Henrik, Trubetskov Michael K., Tikhonravov Alexander V., Ristau Detlev
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 51, ? 36, ñ. 8677-8686
  • 
    • 2011 Comparison of algorithms used for optical characterization of multilayer optical coatings
    • Amotchkina Tatiana V., Trubetskov Michael K., Pervak Vladimir, Schlichting Sebastian, Ehlers Henrik, Ristau Detlev, Tikhonravov A.
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 50, ? 20, ñ. 3389-3395 DOI
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    • 2011 Optical parameters of oxide films typically used in optical coating production
    • Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V., DeBell Gary, Pervak Vladimir, Sytchkova Anna Krasilnikova, Grilli Maria Luisa, Ristau Detlev
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 50, ? 9, ñ. C75-C85 DOI
  • 
    • 2002 Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films
    • Tikhonravov A.V., Trubetskov M.K., Kokarev M.A., Amotchkina T.V., Duparre A., Quesnel E., Ristau D., Gunster S.
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 41, ? 13, ñ. 2555-2560 DOI
  • 
    • 2002 Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
    • Ristau D., Gunster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 41, ? 16, ñ. 3196-3204 DOI
  • 
    • 2001 Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry
    • Tikhonravov A.V., Trubetskov M.K., Krasilnikova A.V., Masetti E., Duparre A., Quesnel E., Ristau D.
    • â æóðíàëå Thin Solid Films, èçäàòåëüñòâî Elsevier Sequoia (Switzerland), òîì 397, ? 1-2, ñ. 229-237 DOI

• Òåçèñû äîêëàäîâ

  • • 2007 Optical Properties of TiO2 ? SiO2 Mixture Thin Films Produced by Ion-Beam Sputtering
    • Amotchkina T.V., Ristau D., Lappschies M., Jup? M., Tikhonravov A.V., Trubetskov M.K.
    • â ñáîðíèêå Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), ìåñòî èçäàíèÿ Tucson, AZ, Washington, DC, òåçèñû, ñ. TuA8
  • • 2003 Investigation of Non-Linear Mechanisms in Dielectric Thin Films Connected with Femtosecond Laser Pulses Propagation
    • Chirkin A., Amotchkina A., Tikhonravov AV, Rustau D., Trubetskov M.K.
    • â ñáîðíèêå Proceedings of XI International Conference Laser-Matter Interaction (LMI-XI), ìåñòî èçäàíèÿ St.Petersburg, òåçèñû, ñ. 42
  • 
    • 2003 Investigations of the nonlinear behaviour of dielectrics by using ultrashort pulses
    • Starke R., Ristau D., Welling H., Amochkina T.V., Tikhonravov A.V., Trubetskov M.K., Tikhonravov A.A., Chirkin A.S.
    • â ñáîðíèêå Proceedings of SPIE, Laser-Induced Damage in Optical Materials: 2003, òîì 5273, òåçèñû, ñ. 501-514 DOI
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    • 2003 Reliable determination of wavelength dependence of thin film refractive index
    • Tikhonravov A., Trubetskov M., Amotchkina T., Andrei Tikhonravov, Ristau D., Gunster S.
    • â ñáîðíèêå Proceedings of SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, òîì 5188, òåçèñû, ñ. 331-342 DOI
  • • 2001 Optical and structural properties of coatings for the UV/VUV-spectral range
    • Gunster S., Ristau D., Bosch S., Duparre A., Masetti E., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â ñáîðíèêå Optical Interference Coatings, OSA Technical Digest (Optical Society of America), ìåñòî èçäàíèÿ Washington DC, òåçèñû, ñ. ThB1-1-ThB1-3
  • 
    • 2001 UV-Optical and microstructural properties of MgF2- and LaF3-coatings deposited by IBS and PVD processes
    • Ristau D., Giinster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â ñáîðíèêå Optical Interference Coatings, OSA Technical Digest (Optical Society of America), ìåñòî èçäàíèÿ Washington DC, òåçèñû, ñ. ThA5-1-ThA5-3