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Дата изменения: Wed Jul 2 02:04:10 2008
Дата индексирования: Fri Sep 5 21:39:13 2008
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XMM-Newton Science Analysis System


odfingest (odfingest-3.28) [xmmsas_20080701_1801-8.0.0]

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OM Configuration Record

After each exposure record there will be an instrument configuration record. If the exposure record describes an OM exposure then the instrument configuration record will be an OM Configuration Record. The record will detail the instrument configuration in terms of the instrument programmable parameter values obtained from the proposal information. This is the information contained within the proposal database which defines the exposure.

OM Configuration Record

Line	Offset	Type	Description	Note
1	0	A16, 64X	'CONFIGURATION OM'	Note 1
2	0	A4 , 76X	No of programmable parameters	Note 2
3	0	A80	IPP1 name value comment	Note 3
...	...	...	...
q+2	0	A80	IPPq name value comment	Note 3

1. Identifies the record as an OM Configuration Record.
2. Identifies the number of lines (number of instrument programmable parameters) to follow
3. The syntax of these lines should be identical to the syntax of a FITS card image (keyword = value / comment) [3,2]