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Документ взят из кэша поисковой машины. Адрес
оригинального документа
: http://xmm.vilspa.esa.es/sas/8.0.0/doc/especplot/node9.html
Дата изменения: Wed Jul 2 02:57:47 2008 Дата индексирования: Fri Sep 5 20:53:33 2008 Кодировка: Поисковые слова: redshift survey |
Subroutine especplot
Recover parameters (Filenames, Binning mode, Device type)
Read source (Src) and background (Bkg) spectrum FITS files :
Get dataset and table.
Check if important keywords exist and are correct.
Call an error if not.
Recover counts and channel columns.
Get energy boundaries (Emin, Emax) using 1PI=1eV
Open plot :
Create view surface in specified device format.
Write labels on it.
Allocate six vectors with Emin&Emax size :
Emed = (Emin + Emax)/2
Edelta = (Emin - Emax)/2
Net_Counts = Src_Counts -
Bkg_Counts*Src_Exposure_Time/Bkg_Exposure_Time
Net_Counts_Err = sqrt(Src_Counts + Bkg_Counts*
((Src_Exposure_Time/Bkg_Exposure_Time)**2))
Bkg_Counts which yet exists
Bkg_Counts_Err = sqrt(Bkg_Counts)
For Net_Counts and Bkg_Counts do :
Rebin Emed, Edelta, Counts, Counts_Err following the specified
binning scheme (auto, size).
Normalize Counts and Counts_Err.
In the new vectors, eliminate each value where :
(Emed-Edelta<=0) or (Counts-Counts_Err<=0)
Plot Y=log(Counts) as a function of X=log(Emed)
Draw errors on plotted points :
log(Counts_Err) for Y-axis
log(Edelta) for X-axis
End for
Return plot on device selected.
Release memory.
Close plot.
End subroutine especplot