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Generation from Ground Calibration Data

Calibration Access and Data Handbook


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Generation from Ground Calibration Data

In the CSL images there is clear evidence of edge emission. The area of edge emission has been flagged as bad pixels by Pinhole images are almost free of any background and are not suitable to identify further defects.

Because of the problem in the OM electronics neither flatfield nor darkframe images were acquired at CSL. Although such measurements are available for the intensifier, these measurements are not directly usable, because they provide relative positional information only. I.e. these measurements are suitable to quantify defects, but not to derive their exact position. The CCD used in these measurements had an arbitrary location in respect to the intensifier. Two images were taken with the CCD rotated by 90 degree to distinguish between intensifier and CCD defects.

The relative position of identified defects to each other can be derived. Study is ongoing whether these defects can be found in the CSL image. In this case these pixels will be added to the badpix file.


next up previous contents
Next: Generation from In-Orbit Data Up: BADPIX Previous: Description   Contents
Michael Smith 2011-09-20