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Generation from In-Orbit Data

Calibration Access and Data Handbook

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Generation from In-Orbit Data

Diagnostic exposures, science exposures and offset maps can be used to identify bad pixels and to confirm the presence of previously identified and up-linked bad pixels.

The integration of the data over each exposure can be used to identify hot or flickering pixels (pixels with repeated occurrence in excess of the local Poisson probability distribution of X-ray events), for example running the SAS task $badpixfind$.


Michael Smith 2011-09-20