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17.1 Flatfield Errors

17.1.1 Thermal-Vacuum versus On-Orbit Flatfields

A full set of flatfield frames was taken with the NICMOS arrays during the System Level Thermal Vacuum test, conducted on the ground in August 1996. However, because of the thermal short experienced by the instrument during the first month of its on-orbit life, NICMOS is operating at a slightly higher temperature than was predicted (59.5 K instead of 57 K). The response of the detector is temperature-dependent, so some changes are expected in the on-orbit flatfields relative to the thermal vacuum results. As part of the Cycle 7 calibration program, a full set of internal and external (earth) flatfields will be obtained. Users are encouraged to recalibrate their data with on-orbit flatfields if the pipeline calibration used thermal vacuum flatfields.

Preliminary results from SMOV indicate that variations in the large scale structure of the on-orbit flatfields relative to the thermal vacuum flatfields are of the order of 1-2% in Camera 2, and up to 5% in Camera 1. Figure 17.1 shows two examples of the ratio of the on-orbit to thermal vacuum flatfields for Camera 2 and Camera 1.

Figure 17.1: Ratio of On-Orbit to Thermal Vacuum Flatfields for Camera 2 in the F110W (left) and Camera 1 in the F140W (right). The ratios are averages across 20 columns and are given as a function of row number.

17.1.2 Characteristics and Uncertainties of Flatfields

Our current knowledge of the NICMOS flatfields is based on tests carried out using a flight spare detector array. The general characteristics are the same for the thermal vacuum flatfields, and we expect them to remain the same for on-orbit flatfields.

NICMOS flatfields show significant large-scale non-uniformity as well as pixel-to-pixel fluctuations. In addition, the non-uniformity is a strong function of the wavelength. Figure 17.3 shows the measured flatfield response for a flight spare array at a number of wavelengths. At 0.8 µm, the most sensitive areas on the array are more than twice as sensitive as the mean, and the least sensitive areas less than half as sensitive (i.e., there is variation by a factor of ~5 in the relative response across the array). This declines to a factor of ~3 at a wavelength of 2.2µm, and at 2.5 µm the array is almost flat. We estimate that the mean uncertainties of the flat field response measurements are ~4%; the accuracy is however largely non-uniform, due to large variations in the response across the detector.

The amplitude of pixel-to-pixel variations in response is displayed in several ways in Figure 17.2, for a wavelength of 1.5 µm. The figure shows that the variations are essentially random with position on the array, and have a typical 1 amplitude ~8% and that the pixel-to-pixel variations are independent of the global response.

Figure 17.2: Flat Field Response Images Using 10% Bandwidth Filters on a Flight Spare Array. Wavelengths used include (a) 0.8µm, (b) 1.5µm, (c) 2.1µm and (d) 2.5µm. The images have been normalized to the mean response for each wavelength. The contours and greyscale are linearly spaced in each image between normalized responses of 0.4 and 2.2. Significant areas of the array span this whole range at 0.8µm, while at 2.5µm the array is almost flat.

Figure 17.3: High Spatial Frequency Noise at 1.5µm. This was measured by dividing the image in Figure 17.2. (b) by a smoothed version of itself. The greyscale version in (a) is scaled between 0.9 and 1.1. Slices through the image are plotted in (b) along row 100 and in (c) along column 100. The distribution of data is plotted as a histogram in (d).

The size of the pixel-to-pixel sensitivity variations with wavelength is similar to that measured for spatial variations in the global flatfield response. At 0.8 µm the standard deviation of the pixel-to-pixel sensitivity variations is ~11%, at 1.5 µm it is ~7%, at 2.1 µm it is ~6%, and at 2.5 µm it is lower than the measurement uncertainties. Figure 17.4 shows the general behaviour of the flat-field response with wavelength, which is similar for low and high frequency variations.

The response of individual pixels relative to the mean of the array as a function of wavelength is given in Figure 17.5, for both low sensitivity and high sensitivity spots. The relative response is a slowly changing function of wavelength between 1.0 and 2.2 µm, while it changes dramatically beyond 2.25 µm, to become a linear function of wavelength.

In summary, NICMOS flatfields indicate:

Figure 17.4: Amplitude of Flat Field Response Variations as a Function of Wavelength. The solid line shows the global flat field response, defined as the standard deviation of the individual pixel responses, while the dashed line shows the pixel-to-pixel variations. The two follow the same behavior very closely.

Figure 17.5: Responses of Selected Pixels Relative to the Mean of the Array as a Function of Wavelength. Both regions of low sensitivity (top panel) and high sensitivity (bottom panel) are considered. These figures show that the response flattens rapidly longward of 2.2 microns.

17.1.3 Color Dependence of Flatfields

The strong wavelength dependence of the NICMOS flatfields will affect the photometric accuracy of sources of extreme colors observed in broad-band filters. An estimate of the photometric accuracy which can be reached in these cases has been obtained simulating a source with color [J-K]=5 (equivalent to a blackbody with temperature T=700 K, e.g., a Young Stellar Object). The main result from the analysis is that the photometric errors are generally small: around 3% in the F110W and F140W filters, around 2% in the F205W filter, and less than 2% in the other filters. However, they represent the limitation in photometric accuracy, unless multi-filter observations are available. In this case, an iterative correction procedure can be used to improve the photometric accuracy.



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