TESTD/CCD

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Дата изменения: Fri Feb 23 12:59:26 1996
Дата индексирования: Tue Oct 2 18:18:56 2012
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TESTD/CCD

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TESTD/CCD

The command does a series of tests on a catalogue of dark frames and produces:

An estimate of the electron analogue-to-ADU conversion factor;
A map of dark current across the CCD.

The command uses the bias offset that is expected in the keyword BIASMEAN is which is produced by the command TESTB/CCD. Alternatively, the user can store the name of the combined created by the command TESTB/CCD bias frame in the keyword BIASMEAN.

Rein Warmels
Mon Jan 22 15:08:15 MET 1996