Документ взят из кэша поисковой машины. Адрес
оригинального документа
: http://www.sao.ru/precise/Midas_doc/doc/95NOV/vol2/node669.html
Дата изменения: Fri Feb 23 12:59:25 1996 Дата индексирования: Tue Oct 2 18:18:47 2012 Кодировка: Поисковые слова: arp 220 |
The quality control can be done by six test commands in the MIDAS CCDTEST context. The commands are called TESTX/CCD where X can be: B for the bias, D for dark, F for flat, T for transfer, S for shutter, and C for charge transfer efficiency. All output ( i.e. ASCII and MIDAS tables, postscript files of graphics and display output) will be put in the users working directory. In addition, the MIDAS logfile will contain a complete log of the results. A description of the commands and the output produced follows below.