TESTF/CCD

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Дата изменения: Fri Feb 23 14:03:52 1996
Дата индексирования: Tue Oct 2 17:26:54 2012
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TESTF/CCD

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TESTF/CCD

The command does a series of tests on a catalogue of low count flat frames and produces:

A combined low count flat frame corrected for the bias offset;
An ASCII and MIDAS table containing traps and other defects in the stacked master flat frame that show values less than N times the median counts in the frame. Only pixels within the input area are considered and repetitions of cold pixels in the increasing y coordinate are not listed.

The combined low count flat field is corrected for the mean bias offset, stored in the keyword BIASMEAN, filled by the command TESTB/CCD. The user can also supply this keyword with the name of the combined bias frame, also produced by TESTB/CCD. In that case this frame will be used for the bias correction.

Pascal Ballester
Tue Mar 28 16:52:29 MET DST 1995