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Interlace Operation in TI Virtual-Phase CCD Image Sensors

JANUARY 1993 SOCA009


IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current. TI warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage ("Critical Applications"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. Inclusion of TI products in such applications is understood to be fully at the risk of the customer. Use of TI products in such applications requires the written approval of an appropriate TI officer. Questions concerning potential risk applications should be directed to TI through a local SC sales office. In order to minimize risks associated with the customer 's applications, adequate design and operating safeguards should be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance, customer product design, software performance, or infringement of patents or services described herein. Nor does TI warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used.

Copyright © 1996, Texas Instruments Incorporated


First Clock Pulse of Field One VW Pixel 1 CW

First Clock Pulse of Field Two VW

CW

VW Pixel 2 CW

VW

CW

VW Pixel n ­ 1 CW

VW

CW

VW Pixel n CW n = Number of Pixels in the Image Area

VW

CW

Figure 1. Virtual-Phase Pixel Structure and Centroid Shift
V High V Mid V Low Field One Readout V High V Mid V Low Field Two Readout

Figure 2. Image-Area Gate Timing for Interlace
NOTES: A. Interlace operation is obtained by performing a centroid shift on the virtual-phase pixels. B. The centroid shift is obtained by holding the image-area gate at mid-level during integrate time and making a mid-to-low transition at the start of field one and then making a mid-to-high transition at the start of field two. C. Optimum midlevel for the image-area gate (IAG) is obtained when the charge is equally distributed between the virtual well (vW) and the clocked well (cW). D. Antiblooming needs to be clocked for interlace to work. E. Adjustment is as follows: IAG midlevel should be low (about ­ 10 V). AB+ should be low (about 0 V). While viewing a saturated target, increase AB+ until the signal is 35% of full well. Increase IAG midlevel until the signal doubles.

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