Документ взят из кэша поисковой машины. Адрес
оригинального документа
: http://www.sao.ru/drabek/CCDP/TUTORIAL/Tutorial.htm
Дата изменения: Thu Nov 12 13:04:48 1998 Дата индексирования: Tue Oct 2 02:11:34 2012 Кодировка: Поисковые слова: р п р п р п р п р п р п р п |
|
Contact Us Products What's New Request for Info Corporate Profile Trade Shows Links Janesick's Corner Software Updates Job Openings Legal Notice Home |
Technical Papers |
Technical Notes |
||
Total dose testing of a CMOS charged-particle spectrometer | Back-illuminated soft X-ray imaging systems | |||
Direct electron imaging using back-thinned CCDs | Performance Comparison: Kodak DCS460 Digital Camera and PixelVision Back-Illuminated CCD | |||
Back-illuminated CCD imaging for low-light-level applications | Compatibility of PCI Bus Cameras and PCs | |||
Electron-bombarded back-illuminated CCD sensors for low-light-level applications | Electron
bombardment radiation damage in Tektronix CCDs |
|||
Issues in the design of systems incorporating electron bombarded CCDs | UV solar-blind, low-light-level sensors | |||
Image Quality | Open pinned phase (OPP) CCDs | |||
Types of solid-state imagers |