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EBCCD tutorial summary and references


SUMMARY

We have discussed the EBS gain mechanism and have pointed out that the noise is most likely greater than just Fano noise due to incomplete charge collection. We have also discussed charge spreading and have given an example of the likelihood of finding a given percentage of charge in the pixel directly bombarded. The sources of noise per pixel have been discussed: unwanted optical signal, dark current shot noise, read noise and dark current fixed pattern noise.

 

REFERENCES

1) R.G. Hier, W. Zheng, E.A. Beaver, C.E. McIlwain, and G.W. Schmidt, "Development of a CCD-Digicon detector system," Advances in Electronics and Electron Systems Vol. 74, pp. 55-67, Academic Press, 1988

2) J.C. Richard, L. Bergonzi and M. Lemonier, "A 604x288 Electron-bombarded CCD image tube for 2D photon counting", SPIE Vol 1338 Optoelectronic Devices and Applications, pp. 241-54, 1990

3) W. Enloe, R. Sheldon, L. Reed and A. Amith, "An electron-bombarded CCD image intensifier with a GaAs photocathode," SPIE Vol 1655 Electron Tubes and Image Intensifiers, pp. 41-49, 1992

4) J.C. Richard, D. Riou and M. Vittot, "Low-light-level TV with image intensifier tubes and CCDs", Advances in Electronics and Electron Physics Vol. 74, pp. 9 -15, Academic Press, 1988

5) G.I. Bryukhnevitch, et. al., "Picosecond image converter tubes incorporated with EB CCDs readout," SPIE Vol 1655 Electron Tubes and Image Intensifiers, pp. 94-105, 1992

6) M. Dunham and P. Sanchez, "Ultimate sensitivity and resolution of phosphor/fiber/charge-coupled-device system," Optical Engineering, Vol. 26 No. 10, pp. 1035-1042, Oct 1987

7) J.C. Cheng, G.R. Tripp and L.W. Coleman, "Intensified CCD readout system for ultrafast streak cameras," J. Applied Physics, Vol. 49, No. 11, pp. 5421-5426, Nov. 1978

8) T. Daud, J. Janesick, K. Evans and T. Elliott, "Charge-coupled-device response to electron beam energies of less than 1 keV up to 20 keV," Optical Engineering, Vol. 26 No. 8, pp. 686-691, Aug. 1987

9) W. van Roosbroeck, "Theory and yield and Fano factor of electron-hole pairs generated in semiconductors by high energy particles," Physical Review, Vol. 139 No. 5A, pp. A1702-16, Aug. 30, 1965

10) M.K. Ravel and A. Reinheimer, "Backside-thinned CCDs for keV electron detection," SPIE Proceedings Vol 1447-10, Feb. 1991