Документ взят из кэша поисковой машины. Адрес оригинального документа : http://www.sao.ru/drabek/CCDP/TUTORIAL/CMOS/tutorial-CMOS-conclusion.htm
Дата изменения: Thu Nov 12 12:25:24 1998
Дата индексирования: Tue Oct 2 13:27:02 2012
Кодировка:

Поисковые слова: arp 220
CMOS tutorial-conclusion

Tutorial-Head1.GIF (19571 bytes)


VI. Conclusions

 

CPS32 charged particle spectrometer chips were total dose tested to 10 krad. The major degradation of these devices, a linear increase in dark current, does not interfere with particle spectrometry operation. The dark current rates and threshold shifts suggest that the device may be useful to doses as high as 100 krad, given the short integration time used for particle spectrometry. The Random Telegraph Signals that give rise to the excess noise in the dark current do not appear to be affected by the radiation. These results also indicate that imaging APS chips will suffer significant degradation, particularly due to dark current fixed pattern noise, but should remain useful for bright scenes to doses above 10 krad, especially with moderate cooling.