Документ взят из кэша поисковой машины. Адрес оригинального документа : http://www.sao.ru/drabek/CCDP/TAPER/HTM_resume/PRINSTON/Cameras/NTE400E.pdf Дата изменения: Thu Sep 24 15:17:36 1998 Дата индексирования: Sat Sep 11 22:05:07 2010 Кодировка: Поисковые слова: mercury surface

CCD Spectrometric Detectors
based on Princeton Instruments exclusive 1340 в 400 CCD

NTE/CCD-400E
· · · · MPP for low dark charge Small height for fast spectral rates Full 26 mm spectral coverage Lowest read noise
100 90 80
Quantum Efficiency, %

70 60 50 40 30 20 10 0 200 300 400 500 600 700 800 900 1000 1100 Front Illuminated with UV Coating Front Illuminated

Wavelength, nm

CCD Arrays Princeton Instruments exclusive front illuminated; MPP only; Available only with Lumogen coating Format 1340 в 400; 26.8 в 8.0 mm overall; 20 в 20 µm pixels; shift register along long axis for parallel mode spectroscopic detection Spectrometric Well Capacity 200,000 electrons Readout Noise 2-3 electrons at 50 kHz; 6-9 electrons at 1 MHz Dynamic Range 14-16 bits Response Nonlinearity < 1% for 16 bits

Response Nonuniformity < ± 4% over entire CCD area, excluding blemish regions Blemish Definitions Dark defect, a pixel with < 80% of the sensitivity of the surrounding pixels when measured at 90%, 50%, 10%, and 1% of full well capacity (includes traps); Hot spot, > 100 times maximum specified dark current level; Column defect, a black, slipped, or white full or partial column Blemish Specifications Grade 1, 20 or fewer dark pixels, 5 or fewer dark clusters, no hot spots, no column defects; higher and lower grades available, contact the factory Operating Temperature -50°C with forced air circulation, coolant circulation capable

Thermostating Precision ±0.040°C over entire temperature range; dark charge stabilized to ±1.2% Typical Dark Charge < 0.05 electron/pixel-second at -50°C Scan Rate 50 kHz to 1 MHz Spectral Rate 60 spectra/second, 100 kHz, full vertical binning; 265 spectra/second, 1MHz, full vertical binning; 300 spectra/second, 1 MHz, full vertical binning, 2X binning along wavelength 1050 spectra/second, 1 MHz, 200 µm tall spectrum, 2X binning along wavelength

Princeton Instruments

June 1998


CCD Spectrometric Detectors
based on Princeton Instruments exclusive 1340 в 400 CCD

NTE/CCD-400EB
· · · · · · Exceptionally high quantum efficiency
Quantum Efficiency, % at -100°C
100 90 80 70 60 50 40 30 20 10 0 200 300 400 500 600 700 800 900 1000 1100 VIS/AR

Lowest read noise Back illuminated MPP for low dark charge Small height for fast spectral rates Full 26 mm spectral coverage

Wavelength, nm

CCD Arrays Princeton Instruments exclusive back illuminated; MPP only; Available only with VIS/AR + Lumogen coating Format 1340 в 400; 26.8 в 8.0 mm overall; 20 в 20 µm pixels; shift register along long axis for parallel mode spectroscopic detection Spectrometric Well Capacity 200,000 electrons Readout Noise 2-4 electrons at 50 kHz; 6-9 electrons at 1 MHz Dynamic Range 14-16 bits Response Nonlinearity < 1% for 16 bits

Response Nonuniformity < ± 4% over entire CCD area, excluding blemish regions Blemish Definitions Dark defect, a pixel with < 80% of the sensitivity of the surrounding pixels when measured at 90%, 50%, 10%, and 1% of full well capacity (includes traps); Hot spot, > 100 times maximum specified dark current level; Column defect, a black, slipped, or white full or partial column Blemish Specifications Grade 1, 20 or fewer dark pixels, 5 or fewer dark clusters, no hot spots, no column defects; higher and lower grades available, contact the factory Operating Temperature -50°C with forced air circulation, coolant circulation capable

Thermostating Precision ±0.040°C over entire temperature range; dark charge stabilized to ±1.2% Typical Dark Charge < 0.05 electron/pixel-second at -50°C Scan Rate 50 kHz to 1 MHz Spectral Rate 60 spectra/second, 100 kHz, full vertical binning; 265 spectra/second, 1MHz, full vertical binning; 300 spectra/second, 1 MHz, full vertical binning, 2X binning along wavelength 1050 spectra/second, 1 MHz, 200 µm tall spectrum, 2X binning along wavelength

Princeton Instruments

June 1998