|
EQUIPMENT USED:
| "SPICA-S" equipment
performance data: |
| energy spectrum of
electrons |
100 keV - 6 MeV;
|
|
energy spectrum of protons
|
8 - 30 MeV;
|
| ion energy deposition range |
1 - 100 MeV (mg/cm2); |
| components subjected to the test
of their logical state change |
SRAM 256 kbit - 4 Mbit, DRAM 16-64
Mbit; |
| components subjected to the test
of parameter drift |
CMOS bipolar operational amplifiers
and components; |
| test microprocessor |
AD 2101. |
|
|
OBJECTIVE:
A study of effects of space radiation on the last-generation
of the off-the-shelf electronic components.
TASKS:
Measuring dynamic behavior of electronic components.
Measuring radiation environment inside ISS RS in the
course of the experiment.
A set of statistical data to improve evaluation models
for the risks to which the components are subjected
when exposed to space radiation.
A feasibility study for the use of last-generation
off-the-shelf components in space flight.
EXPECTED RESULTS:
Digital data written to PCMCIA cards and returned
to Earth for subsequent processing.
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