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Database of Optical Properties -- Level: subpage

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Scatterer models and their characterization

Model parameters LS method free codes speed accuracy range of applic. main purpose usage
H o m o g e n e o u s   p a r t i c l e s
spheres x, m SVM (Mie theory) [1,2] many exteremely high very large no limits in x,m As a first approximation for scatterers of any shape, structure, etc. most often
infinitely long circular cylinders x, m, alpha SVM [3-5] a few exteremely high very large no limits in x,m,alpha As a first approximation when one wants to learn possible effects of nonsphericity of scatterers. seldom
prolate/oblate spheroids x, a/b, m, alpha SVM [6] / EBCM [16,17] several good very large / large certain limits in x,m (see, e.g., our fig.) Study of shape effects since spheroids with different semiaxis ratio present a set of 2D shapes from needles to disks (incl. spheres) often
Chebyshev particles x, e, n, m, alpha EBCM [16,17] several good large (?) certain limits in x,m Study of complex shape effects. seldom
superellipsoids a, b, c, e, n, orient.angles GMT [15] one     certain limits in x,m Possible study of 3D shape effects. --
C o r e - m a n t l e   p a r t i c l e s
spheres xc, mc, xm, mm SVM [7-9] many very high very large no limits in x,m (?) Study of the simplest case of inhomogeneity - two-layered particle. somethimes
infinitely long circular cylinders xc, mc, xm, mm, alpha SVM [10] DOP very high very large no limits in x,m (?) Study of the simplest case of inhomogeneity and nonsphericity - two-layered non-spherical particle. very seldom
prolate/oblate confocal spheroids xc, a/bc, mc, xm, a/bm, mm, alpha SVM [11] / EBCM [13] a few good very large / large certain limits in x,m Study of the shape effects in the simplest case of inhomogeneity - a set of two-layered non-spherical particles. seldom
M u l t i - l a y e r e d   p a r t i c l e s
spheres {xi, mi}, i=1,N SVM [12] a few high very large some limits in x,m (?) Study of the inhomogeneity, e.g. in the case of several well-mixed materials. seldom
axisymmetric particles alpha, {xi, a/bi, mi}, i=1,N EBCM [13] DOP     certain limits in x,m Possible study of shape and structure effects. --
I n h o m o g e n e o u s   p a r t i c l e s
any shape particles with inclusions fi, ... EMT + basic LS method   that of the LS method usually very low limited in x Consideration of shape and inhomogeneity effects. rather often
(fractal) aggregates x, m, D, rho, N, orient.angles DDA [14] a few very low low certain limits in x,m Study of structure and inhomogeneity effects. sometimes

  Parameters:
   -- the size parameter x=2 pi r / lambda, where r is the radius (for spheroids, e.g., the radius of the equivolume sphere), lambda the wavelength of incident radiation;
   -- m=n+ki is the complex rafractive index (see corresponding section for more details);
   -- alpha is the radiation incidence angle (usually between a symmetry axis and the wavevector);
   -- the aspect ratio a/b, where a,b are the major and minor semiaxes;
   -- The axisymmetric Chebyshev particles have the surface equation R(theta) = r (1 + e cos(n*theta)), where r,e,n are free parameters;
   -- fi is the volume fraction of inclusions;
   -- for the meaning of the parameters x, m, D, rho, N see here;
   -- for the meaning of the parameters a,b,c,e,n see [15].  

  References:
[1] Mie G. (1908) Ann. Phys. 25, 377.
[2] Debye P. (1909) Ann. Phys. 30, 57.
[3] Lord Rayleigh (1881) Phil. Mag. 12, 81.
[4] Wait J.R. (1955) Can. J. Phys. 33, 189.
[5] Lind A.C., Greenberg J.M. (1966) J. Appl. Phys. 37, 3195.
[6] Asano S., Yamamoto G. (1975) Appl. Opt. 14, 29.
[7] Aden A.L., Kerker M. (1951) J. Appl. Phys. 22, 1242.
[8] Shifrin K.S. (1952) Izv. Acad. Nauk USSR N2, 15.
[9] Guettler A. (1952) Ann. Phys. 6, 65.
[10] Shah G.A. (1972) Mon. Not. Roy. Astr. Soc. 148, 93.
[11] Onaka T. (1980) Ann. Tokyo Obs. 18, 1.
[12] Wu Z.P., Wang Y.P. (1991) Radio Sci. 26, 1393.(?)
[13] Peterson B., Stroem S. (1974) Phys. Rev. D 10, 2670.
[14] Purcell E.M., Pennypacker C.R. (1973) Astrophys.J. 186, 705.
[15] Wriedt Th. (2002) Part. Part. Syst. Charact. 19, 256.
[16] Waterman (1971) Phys. Rev. D 3, 825.
[17] Barber P., Yeh C. (1975) Appl. Opt. 14, 2864.

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