ÈÑÒÈÍÀ

Masetti E.

Ñîàâòîðû: Òèõîíðàâîâ À.Â., Òðóáåöêîâ Ì.Ê., Duparre A., Krasilnikova A.V., Quesnel E., Ristau D., Bosch S., Kiriakidis G., Peiro F., Tikhonravov A.A., Êîêàðåâ Ì.À., Ferre-Borrull J., Gunster S. ïîêàçàòü ïîëíîñòüþ..., Arens W., Piero F., Popov K.V., Êî÷èêîâ È.Â., Jacob D., DRistau, Flemming M., Giinster S.

3 ñòàòüè, 7 òåçèñîâ äîêëàäîâ

Êîëè÷åñòâî öèòèðîâàíèé ñòàòåé â æóðíàëàõ ïî äàííûì Web of Science: 89, Scopus: 105

IstinaResearcherID (IRID): 543581

Äåÿòåëüíîñòü ñòèëü:  îáû÷íûé | ÃÎÑÒ | plain | abbrv | acm | alpha | amsalpha | amsplain | apalike | ieeetr | siam

• Ñòàòüè â æóðíàëàõ

  • 
    • 2002 Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
    • Ristau D., Gunster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â æóðíàëå Applied optics, èçäàòåëüñòâî Optical Society of America (United States), òîì 41, ? 16, ñ. 3196-3204 DOI
  • 
    • 2001 Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry
    • Tikhonravov A.V., Trubetskov M.K., Krasilnikova A.V., Masetti E., Duparre A., Quesnel E., Ristau D.
    • â æóðíàëå Thin Solid Films, èçäàòåëüñòâî Elsevier Sequoia (Switzerland), òîì 397, ? 1-2, ñ. 229-237 DOI

• Ñòàòüè â ñáîðíèêàõ

  • • 1998 Spectroscopic ellipsometry of slightly inhomogeneous thin films: application of the new approximation for the ellipsometric angles and
    • Tikhonravov A.V., Trubetskov M.K., Krasillnikova A.V., Masetti E.
    • â ñáîðíèêå Optical Interference Coatings, Technical Digest Series (Optical Society of America), ìåñòî èçäàíèÿ Washington DC, òîì 9, ñ. 141-143

• Òåçèñû äîêëàäîâ

  • • 2003 Accurate determination of lanthanum fluoride refractive index by spectroscopic ellipsometry
    • Tikhonravov AV, Trubetskov MK, Kokarev MA, Tikhonravov AA, Masetti E., Krasilnikova A.V.
    • â ñáîðíèêå 3rd International Conference on Spectroscopic Ellipsometry, ìåñòî èçäàíèÿ Vena, òåçèñû
  • • 2003 Comparative investigation of thin film surface roughness by atomic force microscopy and spectroscopic ellipsometry
    • Tikhonravov AV, Trubetskov MK, Kokarev MA, Tikhonravov A.A., Duparr? A., Flemming M., Masetti E., Krasilnikova and A.V
    • â ñáîðíèêå 3rd International Conference on Spectroscopic Ellipsometry, ìåñòî èçäàíèÿ Vena, òåçèñû
  • • 2001 Optical and structural properties of coatings for the UV/VUV-spectral range
    • Gunster S., Ristau D., Bosch S., Duparre A., Masetti E., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â ñáîðíèêå Optical Interference Coatings, OSA Technical Digest (Optical Society of America), ìåñòî èçäàíèÿ Washington DC, òåçèñû, ñ. ThB1-1-ThB1-3
  • 
    • 2001 UV-Optical and microstructural properties of MgF2- and LaF3-coatings deposited by IBS and PVD processes
    • Ristau D., Giinster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
    • â ñáîðíèêå Optical Interference Coatings, OSA Technical Digest (Optical Society of America), ìåñòî èçäàíèÿ Washington DC, òåçèñû, ñ. ThA5-1-ThA5-3
  • 
    • 1999 Sensitivity of the ellipsometric angles Psi and Delta to the surface inhomogeneity
    • Tikhonravov A.V., Trubetskov M.K., Masetti E., Krasilnikova A.V., Kochikov I.V.
    • â ñáîðíèêå Proceedings of SPIE, Advances in Optical Interference Coatings, òîì 3738, òåçèñû, ñ. 173-182 DOI
  • 
    • 1999 UV-Optical and Microstructural Properties of MgF2 ?Coatings Deposited by IBS and PVD Processes
    • DRistau, Arens W., Bosch S., Duparre A., Masetti E., Jacob D., Kiriakidis G., Piero F., Quesnel E., Tikhonravov A.
    • â ñáîðíèêå Proceedings of SPIE, Advances in Optical Interference Coatings, òîì 3738, òåçèñû, ñ. 436-445 DOI
  • • 1997 Application of spectroscopic ellipsometry to the characterization of inhomogeneous transparent thin films
    • Tikhonravov A.V., Masetti E., Krasilnikova AV, Popov K., Trubetskov MK
    • â ñáîðíèêå Abstract for the Second International Conference On Spectroscopic Ellipsometry, ìåñòî èçäàíèÿ Charleston, South Carolina, USA, òåçèñû, ñ. 12-15