Документ взят из кэша поисковой машины. Адрес оригинального документа : http://xmm.vilspa.esa.es/sas/6.5.0/doc/epexposure/node4.html
Дата изменения: Tue Aug 16 07:50:05 2005
Дата индексирования: Sat Dec 22 11:23:34 2007
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Поисковые слова: arp 220

XMM-Newton Science Analysis System


epexposure (epexposure-0.6.2) [xmmsas_20050815_1803-6.5.0]

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Basic Idea

There are several different deadtime contributions that have to be taken into account during the EPIC pn ODF processing: one factor depends solely on the readout mode, the second is related to deadtimes due to discarded CCD columns because of on-board MIP (Minimum Ionizing Particle) rejection, the third factor represents additional deadtimes from MIP rejection per frame per CCD by ground software. The fourth livetime factor handles the case that not all frames have been transmitted because of telemetry limits. Finally, quadrant and CCD specific deadtimes are caused by the bad frame flagging in epframes.